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Applied Scanning Probe Methods III [electronic resource] :Characterization / edited by Bharat Bhushan, Harald Fuchs.

by Bhushan, Bharat [editor.]; Fuchs, Harald [editor.]; SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: NanoScience and Technology: Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.Description: XLIII, 378 p. 268 illus. online resource.ISBN: 9783540269106.Subject(s): Chemistry | Analytical biochemistry | Chemistry, Physical organic | Polymers | Particles (Nuclear physics) | Nanotechnology | Surfaces (Physics) | Chemistry | Nanotechnology | Surfaces and Interfaces, Thin Films | Polymer Sciences | Physical Chemistry | Solid State Physics and Spectroscopy | Analytical ChemistryOnline resources: Click here to access online
Contents:
Atomic Force Microscopy in Nanomedicine -- Scanning Probe Microscopy: From Living Cells to the Subatomic Range -- Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces -- Probing Macromolecular Dynamics and the Influence of Finite Size Effects -- Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum -- One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures -- Scanning Probe Microscopy Applied to Ferroelectric Materials -- Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy -- AFM Applications for Contact and Wear Simulation -- AFM Applications for Analysis of Fullerene-Like Nanoparticles -- Scanning Probe Methods in the Magnetic Tape Industry.
In: Springer eBooksSummary: Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.
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Atomic Force Microscopy in Nanomedicine -- Scanning Probe Microscopy: From Living Cells to the Subatomic Range -- Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces -- Probing Macromolecular Dynamics and the Influence of Finite Size Effects -- Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum -- One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures -- Scanning Probe Microscopy Applied to Ferroelectric Materials -- Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy -- AFM Applications for Contact and Wear Simulation -- AFM Applications for Analysis of Fullerene-Like Nanoparticles -- Scanning Probe Methods in the Magnetic Tape Industry.

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

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