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Applied Scanning Probe Methods IV [electronic resource] :Industrial Applications / edited by Bharat Bhushan, Harald Fuchs.

by Bhushan, Bharat [editor.]; Fuchs, Harald [editor.]; SpringerLink (Online service).

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Contents:

Scanning Probe Lithography for Chemical, Biological and Engineering Applications -- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM) -- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography -- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography -- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM) -- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection -- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices -- Applications of Heated Atomic Force Microscope Cantilevers.

In: Springer eBooksSummary: Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

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Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

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Applied Scanning Probe Methods IV [electronic resource] :Industrial Applications / edited by Bharat Bhushan, Harald Fuchs.

by Bhushan, Bharat [editor.]; Fuchs, Harald [editor.]; SpringerLink (Online service).

Browsing MAIN LIBRARY Shelves Close shelf browser