Applied Charged Particle Optics [electronic resource] /by Helmut Liebl.
by Liebl, Helmut [author.]; SpringerLink (Online service).
Material type:
BookPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008.Description: online resource.ISBN: 9783540719250.Subject(s): Physics | Engineering | Physics | Optics, Optoelectronics, Plasmonics and Optical Devices | Engineering, generalDDC classification: 621.36 Online resources: Click here to access online
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Springer eBooksSummary: Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
Lenses: Basic Optics -- Electrostatic Deflection -- Magnetic Deflection -- Image Aberrations -- Fringe Field Confinement.
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| TA1501-1820 (Browse shelf) | Available | ||||
| QC392-449.5 (Browse shelf) | Available | ||||
| TA1750-1750.22 (Browse shelf) | Available | ||||
| Long Loan | MAIN LIBRARY | QC350-467 (Browse shelf) | Available |
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| TA401-492 Multifunctional Barriers for Flexible Structure | TA1750-1750.22 Organic Nanostructures for Next Generation Devices | QC350-467 Applied Charged Particle Optics | TA1501-1820 Applied Charged Particle Optics | QC392-449.5 Applied Charged Particle Optics | TA1750-1750.22 Applied Charged Particle Optics | Optical Measurement Techniques |
Lenses: Basic Optics -- Electrostatic Deflection -- Magnetic Deflection -- Image Aberrations -- Fringe Field Confinement.
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
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