Noncontact Atomic Force Microscopy [electronic resource] :Volume 2 / edited by Seizo Morita, Franz J. Giessibl, Roland Wiesendanger.
by Morita, Seizo [editor.]; Giessibl, Franz J [editor.]; Wiesendanger, Roland [editor.]; SpringerLink (Online service).
Material type:
BookSeries: NanoScience and Technology: Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.Description: XVIII, 401p. 105 illus., 77 illus. in color. online resource.ISBN: 9783642014956.Subject(s): Engineering | Nanotechnology | Materials Science | Nanotechnology | Engineering, general | Condensed Matter PhysicsDDC classification: 620.115 Online resources: Click here to access online | Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| TA418.9.N35 (Browse shelf) | Available | ||||
| Long Loan | MAIN LIBRARY | T174.7 (Browse shelf) | Available |
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Method for Precise Force Measurements -- Force Spectroscopy on Semiconductor Surfaces -- Tip–Sample Interactions as a Function of Distance on Insulating Surfaces -- Force Field Spectroscopy in Three Dimensions -- Principles and Applications of the qPlus Sensor -- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond -- Atom Manipulation on Semiconductor Surfaces -- Atomic Manipulation on Metal Surfaces -- Atomic Manipulation on an Insulator Surface -- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM -- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces -- Magnetic Exchange Force Microscopy -- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) -- Frequency Modulation Atomic Force Microscopy in Liquids -- Biological Applications of FM-AFM in Liquid Environment -- High-Frequency Low Amplitude Atomic Force Microscopy -- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
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