Koha online

Your cart is empty.
Normal view MARC view ISBD view

Nanotribology and Nanomechanics I [electronic resource] :Measurement Techniques and Nanomechanics / edited by Bharat Bhushan.

by Bhushan, Bharat [editor.]; SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg : 2011.Description: XVIII, 623p. 341 illus. online resource.ISBN: 9783642152832.Subject(s): Engineering | Nanotechnology | Engineering | Nanotechnology and Microengineering | Nanotechnology | Nanoscale Science and TechnologyDDC classification: 620.5 Online resources: Click here to access online
Contents:
Introduction - Measurement Techniques and Applications -- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes -- General and Special Probes in Scanning Microscopies -- Force Calibration Techniques for AFM Cantilevers -- Noncontact Atomic Force Microscopy and Related Topics -- Low Temperature Scanning Probe Microscopy -- Dynamic Modes of Atomic Force Microscopy -- Molecular Single Molecular Recognition Force Spectroscopy and Imaging -- Nanomechanical Properties of Solid Surfaces and Thin Films -- Computer Simulations of Nanometer-Scale Indentation and Friction.
In: Springer eBooksSummary: The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.
Tags from this library: No tags from this library for this title. Add tag(s)
Log in to add tags.
    average rating: 0.0 (0 votes)

Introduction - Measurement Techniques and Applications -- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes -- General and Special Probes in Scanning Microscopies -- Force Calibration Techniques for AFM Cantilevers -- Noncontact Atomic Force Microscopy and Related Topics -- Low Temperature Scanning Probe Microscopy -- Dynamic Modes of Atomic Force Microscopy -- Molecular Single Molecular Recognition Force Spectroscopy and Imaging -- Nanomechanical Properties of Solid Surfaces and Thin Films -- Computer Simulations of Nanometer-Scale Indentation and Friction.

The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.

There are no comments for this item.

Log in to your account to post a comment.
@ Jomo Kenyatta University Of Agriculture and Technology Library

Powered by Koha