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Hardware and Software: Verification and Testing [electronic resource] :6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers / edited by Sharon Barner, Ian Harris, Daniel Kroening, Orna Raz.

by Barner, Sharon [editor.]; Harris, Ian [editor.]; Kroening, Daniel [editor.]; Raz, Orna [editor.]; SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Lecture Notes in Computer Science: 6504Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2011.Description: X, 197p. online resource.ISBN: 9783642195839.Subject(s): Computer science | Software engineering | Logic design | Computer Science | Software Engineering | Logics and Meanings of Programs | Programming Languages, Compilers, InterpretersDDC classification: 005.1 Online resources: Click here to access online In: Springer eBooksSummary: This book constitutes the thoroughly refereed post-conference proceedings of the 6th International Haifa Verification Conference, HVC 2010, held in Haifa, Israel in October 2010. The 10 revised full papers presented together with 7 invited papers were carefully reviewed and selected from 30 submissions. The papers address all current issues, challenges and future directions of verification for hardware, software, and hybrid systems and have a research focus on hybrid methods and the migration of methods and ideas between hardware and software, static and dynamic analysis, pre- and post-silicon.
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This book constitutes the thoroughly refereed post-conference proceedings of the 6th International Haifa Verification Conference, HVC 2010, held in Haifa, Israel in October 2010. The 10 revised full papers presented together with 7 invited papers were carefully reviewed and selected from 30 submissions. The papers address all current issues, challenges and future directions of verification for hardware, software, and hybrid systems and have a research focus on hybrid methods and the migration of methods and ideas between hardware and software, static and dynamic analysis, pre- and post-silicon.

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