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Ellipsometry of Functional Organic Surfaces and Films [electronic resource] /edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.

by Hinrichs, Karsten [editor.]; Eichhorn, Klaus-Jochen [editor.]; SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Springer Series in Surface Sciences: 52Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : 2014.Description: XXI, 363 p. 216 illus., 55 illus. in color. online resource.ISBN: 9783642401282.Subject(s): Physics | Chemistry, Physical organic | Surfaces (Physics) | Physics | Surface and Interface Science, Thin Films | Surfaces and Interfaces, Thin Films | Physical Chemistry | Optics, Optoelectronics, Plasmonics and Optical Devices | Characterization and Evaluation of MaterialsDDC classification: 530.417 Online resources: Click here to access online
Contents:
Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared brillant light sources for micro-ellipsometric studies of organic films -- Collection of optical constants of organic layers.
In: Springer eBooksSummary: Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
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Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared brillant light sources for micro-ellipsometric studies of organic films -- Collection of optical constants of organic layers.

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

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