The Role of Microscopy in Semiconductor Failure Analysis
by Richards, B.P; Footner, P.K.
Publisher: Oxford Oxford University Press 1992Description: p108.ISBN: 0198564325.Subject(s): Semiconductors-Testing | Semiconductors-Failures| Item type | Current location | Call number | url | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| Long Loan | MAIN LIBRARY | TK7871.85.R52 (Browse shelf) | 7208 | Available | 28435 |
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| TK7874.P6 1983 The Microp[rocessor Handbook | TK7874.P6 1983 The Microp[rocessor Handbook | TK7874.P6 1983 The Microp[rocessor Handbook | TK7871.85.R52 The Role of Microscopy in Semiconductor Failure Analysis | TT896.5.M45 Traditional Candle Making | TT896.5.M45 Traditional Candle Making | NA 2000 .S7 Architectural Morphology |
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