Hierachical Modeling for VLSI Circuit Testing
by Bhattacharya Debashis.
Publisher: Boston Kluwer academic Publishers 1990Description: p159.ISBN: 079239058x.Subject(s): Integrated Circuits| Item type | Current location | Call number | url | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| Long Loan | MAIN LIBRARY | TK7874.B48 1990 (Browse shelf) | 7240 | Available | 27683 |
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