Normal view MARC view ISBD view

Assessing Fault Model Test Quality

by Butler,Kenneth.M.
Publisher: Boston Kluwer academic Publishers 1992Description: p132.ISBN: 0792392221.Subject(s): Digita Integrated Circuits
Tags from this library: No tags from this library for this title. Add tag(s)
Log in to add tags.
    average rating: 0.0 (0 votes)
Item type Current location Call number url Status Date due Barcode
Long Loan MAIN LIBRARY
Tk7874.B87 1992 (Browse shelf) 7262 Available 28334

There are no comments for this item.

Log in to your account to post a comment.
@ Jomo Kenyatta University Of Agriculture and Technology Library

Powered by Koha