Strain Effect in Semiconductors [electronic resource] :Theory and Device Applications / by Yongke Sun, Scott E. Thompson, Toshikazu Nishida.
by Sun, Yongke [author.]; Thompson, Scott E [author.]; Nishida, Toshikazu [author.]; SpringerLink (Online service).
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BookPublisher: Boston, MA : Springer US, 2010.Edition: First.Description: online resource.ISBN: 9781441905529.Subject(s): Engineering | Electronics | Optical materials | Engineering | Electronics and Microelectronics, Instrumentation | Solid State Physics | Spectroscopy and Microscopy | Optical and Electronic MaterialsDDC classification: 621.381 Online resources: Click here to access online | Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| TK7874-7874.9 (Browse shelf) | Available | ||||
| Long Loan | MAIN LIBRARY | TK7800-8360 (Browse shelf) | Available |
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Overview: The Age of Strained Devices -- Band Structures of Strained Semiconductors -- Stress, Strain, Piezoresistivity, and Piezoelectricity -- Strain and Semiconductor Crystal Symmetry -- Band Structures of Strained Semiconductors -- Low-Dimensional Semiconductor Structures -- Transport Theory of Strained Semiconductors -- Semiconductor Transport -- Strain in Semiconductor Devices -- Strain in Electron Devices -- Piezoresistive Strain Sensors -- Strain Effects on Optoelectronic Devices.
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strain-based MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.
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