Scanning Transmission Electron Microscopy [electronic resource] :Imaging and Analysis / edited by Stephen J. Pennycook, Peter D. Nellist.
by Pennycook, Stephen J [editor.]; Nellist, Peter D [editor.]; SpringerLink (Online service).
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BookPublisher: New York, NY : Springer New York : 2011.Description: XII, 762 p. online resource.ISBN: 9781441972002.Subject(s): Microscopy | Optical materials | Nanotechnology | Surfaces (Physics) | Materials Science | Optical and Electronic Materials | Characterization and Evaluation of Materials | Biological Microscopy | Solid State Physics | Condensed Matter Physics | NanotechnologyDDC classification: 620.11295 | 620.11297 Online resources: Click here to access online | Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| MAIN LIBRARY | TA1750-1750.22 (Browse shelf) | Available |
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| RD1-811 Surgical Mentoring | TK1-9971 Cooperative Communications and Networking | RC321-580 Genomics, Proteomics, and the Nervous System | TA1750-1750.22 Scanning Transmission Electron Microscopy | RC261-271 Signaling Pathways in Squamous Cancer | RC681-688.2 Genes and Cardiovascular Function | QH301-705 Advances in Systems Biology |
Electron Optics and Aberration Correction -- Fundamentals of Scattering Theory -- Image formation in STEM -- Electron energy loss spectroscopy -- Energy dispersive x-ray analysis -- STEM of complex oxides -- STEM of complex alloys -- STEM of catalysts -- STEM of semiconductor devices -- STEM of ceramic materials -- STEM of quasicrystals -- STEM of nanomaterials -- 3D STEM: tomography -- 3D STEM: depth slicing -- Nanobeam diffraction.
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analysis provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the history of the field, the instrument, image formation and scattering theory, as well as practical aspects of imaging and analysis. The authors present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, and nanoscience. Therefore this is a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
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