Hierachical Modeling for VLSI Circuit Testing
by Bhattacharya Debashis.
Publisher: Boston Kluwer academic Publishers 1990Description: p159.ISBN: 079239058x.Subject(s): Integrated Circuits| Item type | Current location | Call number | url | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| Long Loan | MAIN LIBRARY | TK7874.B48 1990 (Browse shelf) | 7240 | Available | 27683 |
Browsing MAIN LIBRARY Shelves Close shelf browser
| No cover image available | ||||||||
| TK7871.85.R88 Solid-State Electronics | TK7871.85.R88 Solid-State Electronics | TK7871.85.R88 Solid-State Electronics | TK7874.B48 1990 Hierachical Modeling for VLSI Circuit Testing | TS176.K65 Manufacturing Technology | TP155.P36 1982 Reaction Engeneering Through Solved Problems. | TK7876.M52V1 1993 The Microwave Engineering Handbook |
There are no comments for this item.